MTSE 6620 - Advanced Electron and Ion Microscopy

2 hours

Gives students with existing electron and ion microscopy backgrounds the opportunity to gain theoretical and practical knowledge of advanced analytical techniques. Specific advanced topics include focused ion beam specimen preparation and patterning, Z-contrast scanning transmission electron microscopy, advanced diffraction and defect analysis, electron energy loss spectroscopy and energy filtered imaging in the transmission electron microscope, high resolution transmission electron microscopy imaging and 3D imaging of nanostructures using focused ion beam and tilt-series transmission electron microscopy. Specific applications of these techniques to modern problems in materials science are stressed.

Prerequisite(s): MTSE 6600, MTSE 6605.